|Title of the article||
DETERMINATION OF SnO2 THIN OPTICALLY TRANSPARENT
Kondrashin Vladislav Igorevich, Postgraduate student, Penza State University (40 Krasnaya street, Penza, Russia), email@example.com
Background. Transparent conductive coatings based on thin films of metal oxides are widely used in various optoelectronic devices. Films’ thickness plays an important role in formation of their electrical and optical properties, therefore this parameter must be measured constantly. However, measuring thickness of thin transparent films using traditional methods is difficult to complete due to certain restrictions. This problem is solved by the envelope method, which consists in analysis of interference extremes distribution in transmission spectra of thin films. Thepurpose of the work is to determine thickness of tin dioxide films by the envelope method, its accuracy and application conditions.
transparent films, spray pyrolysis, thickness, envelope method, transmission spectra, interference extremes, envelope curves, interpolation.
1. Kondrashin V. I., Rybakova N. O., Raksha S. V., Shamin A. A., Nikolaev K. O. Molodoy uchenyy [The young scientist]. 2015, no. 13, pp. 128−132.
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